Single and repetitive short-pulse high-power microwave window breakdown

被引:19
作者
Chang, C. [1 ]
Shao, H. [2 ]
Chen, C. H. [2 ]
Tang, C. X. [1 ]
Huang, W. H. [2 ]
机构
[1] Tsinghua Univ, Dept Engn Phys, Key Lab Particle & Radiat Imaging, Minist Educ, Beijing 100084, Peoples R China
[2] NW Inst Nucl Technol, Xian 710024, Shannxi, Peoples R China
关键词
dielectric losses; electric breakdown; microwave switches; plasma density; vaporisation;
D O I
10.1063/1.3396367
中图分类号
O35 [流体力学]; O53 [等离子体物理学];
学科分类号
070204 ; 080103 ; 080704 ;
摘要
The mechanisms of high-power microwave breakdown for single and repetitive short pulses are analyzed. By calculation, multipactor saturation with electron density much higher than the critical plasma density is found not to result in microwave cutoff. It is local high pressure about Torr class that rapid plasma avalanche and final breakdown are realized in a 10-20 ns short pulse. It is found by calculation that the power deposited by saturated multipactor and the rf loss of protrusions are sufficient to induce vaporizing surface material and enhancing the ambient pressure in a single short pulse. For repetitive pulses, the accumulation of heat and plasma may respectively carbonize the surface material and lower the repetitive breakdown threshold. (C) 2010 American Institute of Physics. [doi: 10.1063/1.3396367]
引用
收藏
页数:6
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