Electrochemical migration of Ag in Na2SO4 environment

被引：0
|
作者：
Medgyes, Balint [1 ]
Adam, Sandor [1 ]
Szikora, Bela [1 ]
Gal, Laszlo [1 ]
Tamasi, Patrik [1 ]
机构：
[1] Budapest Univ Technol & Econ, Dept Elect Technol, Budapest, Hungary
来源：
2015 IEEE 21ST INTERNATIONAL SYMPOSIUM FOR DESIGN AND TECHNOLOGY IN ELECTRONIC PACKAGING (SIITME) | 2015年
关键词：
electrochemical migration; water drop test; Na2SO4; solution; Ag; PRINTED-CIRCUIT BOARD; LAYER;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The effect of sulphate ion concentration on electrochemical migration (ECM) of silver was investigated by applying an in-situ optical and electrical inspection system. It was found that dendrites grow not only in an electrolyte solution with low sulphate ion concentration but also in electrolytes with medium and high or even saturated sulphate ion concentrations. According to the Mean-Time-To-Failure (MTTF) values, the migration susceptibility was decreased with the increase of sulphate ion concentration in case of low and medium concentration levels. However, the ECM susceptibility was increased at saturated concentration level.
引用
收藏
页码：377 / 380
页数：4
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