The effect of substrate surface smoothness on the chevron layer structure of surface-stabilized ferroelectric liquid crystals

被引：0

作者：

Furue, H ^{[1
]}

Takahashi, T ^{[1
]}

Kobayashi, S ^{[1
]}

机构：

[1] Sci Univ Tokyo, Inst Liquid Crystal, Yamaguchi 7560884, Japan

来源：

FERROELECTRICS | 2000年 / 244卷 / 1-4期

关键词：

SSFLC; zigzag defect; surface smoothness; chevron layer; free energy;

D O I：

暂无

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

dFor freedom from zigzag defects in SSFLCD, it is important to research in detail the effect of surface smoothness of substrate on the chevron layer structure. We have studied the effect df surface roughness of undercoating layer on the surface smoothness of alignment film and then the alignment structure of SSFLC. Furthermore, we suggest a model for explaining the freedom from defects in a SSFLC by investigating theoretically the free energy of C1 and C2 chevron structure.

引用

页码：375 / 382

页数：8

共 23 条

[21] Characterization of the local layer structure at a broad wall in a surface stabilized ferroelectric liquid crystal during electric field application using synchrotron X-ray microdiffraction
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[22] Electro-Optic Switching in Polymer Waveguide Using Surface Stabilized Ferroelectric Liquid Crystal
Yoshino, Katsumi
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[23] Defect-free bistable C1 surface stabilized ferroelectric liquid crystal display
Wang, CH
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Handschy, M
Bos, PJ
[J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2004, 43 (6A): : 3479 - 3483

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