A novel technique to measure the propagation loss of integrated optical waveguides

被引：5

作者：

Fazludeen, R ^{[1
]}

Barai, S ^{[1
]}

Prasant, PK ^{[1
]}

Srinivas, T ^{[1
]}

Selvarajan, A ^{[1
]}

机构：

[1] Indian Inst Sci, Dept Elect Commun Engn, Appl Photon Lab, Bangalore 560012, Karnataka, India

来源：

IEEE PHOTONICS TECHNOLOGY LETTERS | 2005年 / 17卷 / 02期

关键词：

annealed proton exchanged (APE) waveguide; coupling conditions; integrated optics; propagation loss;

D O I：

10.1109/LPT.2004.839450

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A novel method is presented to measure the propagation loss of integrated optical waveguides. The measurement system involves two 3-dB couplers, a charge coupled device camera, and a signal processing unit. The propagation loss measured from this technique is found to be independent of coupling conditions. The propagation properties of low to high loss waveguides prepared by annealed proton exchange (APE) in lithium niobate (LiNbO3) and silver ion exchange in BK7 glass substrates are examined. The measurement system is found to be feasible over a broad range. This method offers a precision of 0.04 dB in case of a 25-mm-long waveguide prepared by APE.

引用

页码：360 / 362

页数：3

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