Direct measurement of group dispersion of optical components using white-light spectral interferometry

被引:10
作者
Chlebus, R. [1 ]
Hlubina, P. [1 ]
Ciprian, D. [1 ]
机构
[1] Tech Univ Ostrava, Dept Phys, CS-70833 Ostrava, Czech Republic
关键词
spectral interferometry; white-light source; low-resolution spectrometer; Mach-Zehnder interferometer; group refractive index; dispersion; quartz crystal; holey fiber;
D O I
10.2478/s11772-007-0010-z
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We present a simple white-light spectral interferometric technique employing a low-resolution spectrometer for a direct measurement of the group dispersion of optical components over a wide wavelength range. The technique utilizes an unbalanced Mach-Zehnder interferometer with a component under test inserted in one arm and the other arm with adjustable path length. We record a series of spectral interferograms to measure the equalization wavelength as a function of the path length difference. We measure the absolute group refractive index as a function of wavelength for a quartz crystal of known thickness and the relative one for optical fiber In the latter case we use a microscope objective in front and a lens behind the fiber and subtract their group dispersion, which is measured by a technique of tandem interferometry including also a Michelson interferometer.
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页码:144 / 148
页数:5
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