Experimental evidence for an optical interference model for vibrational sum frequency generation on multilayer organic thin film systems. I. Electric dipole approximation

被引:20
作者
O'Brien, Daniel B. [1 ]
Massari, Aaron M. [1 ]
机构
[1] Univ Minnesota Twin Cities, Dept Chem, Minneapolis, MN 55455 USA
基金
美国国家科学基金会;
关键词
FIELD-EFFECT TRANSISTORS; LIQUID-CRYSTAL ALIGNMENT; X-RAY-SCATTERING; MOLECULAR-ORIENTATION; 2ND-HARMONIC GENERATION; SOLAR-CELLS; SURFACE ORIENTATION; CONTACT RESISTANCE; REFRACTIVE-INDEX; SILICA GLASS;
D O I
10.1063/1.4904924
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
In the field of vibrational sum frequency generation spectroscopy (VSFG) applied to organic thin film systems, a significant challenge to data analysis is in the accurate description of optical interference effects. Herein, we provide experimental evidence that a model recently developed in our lab provides an accurate description of this phenomenon. We studied the organic small molecule N,N'-dioctyl-3,4,9,10-perylenedicarboximide vapor deposited as a thickness gradient on silicon wafer substrates with two oxide thicknesses and two surface preps. VSFG data were obtained using the ssp and the sps polarization combinations in the imide carbonyl stretching region as a function of organic thickness. In this first of two reports, the data are modeled and interpreted within the ubiquitous electric dipole approximation for VSFG. The intrinsic sample responses are parameterized during the fitting routines while optical interference effects are simply calculated from the model using known refractive indices, thin film thicknesses, and beam angles. The results indicate that the thin film model provides a good description of optical interferences, indicating that interfacial terms are significant. Inconsistencies between the fitting results within the bounds of the electric dipole response motivate deliberation for additional effects to be considered in the second report. (C) 2015 AIP Publishing LLC.
引用
收藏
页数:15
相关论文
共 86 条
[1]   ELECTRONIC-PROPERTIES OF TWO-DIMENSIONAL SYSTEMS [J].
ANDO, T ;
FOWLER, AB ;
STERN, F .
REVIEWS OF MODERN PHYSICS, 1982, 54 (02) :437-672
[3]   Monitoring the Charge Accumulation Process in Polymeric Field-Effect Transistors via in Situ Sum Frequency Generation [J].
Anglin, Timothy C. ;
O'Brien, Daniel B. ;
Massari, Aaron M. .
JOURNAL OF PHYSICAL CHEMISTRY C, 2010, 114 (41) :17629-17637
[4]   METAL CONTAMINATION REMOVAL ON SILICON-WAFERS USING DILUTE ACIDIC SOLUTIONS [J].
ANTTILA, OJ ;
TILLI, MV .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1992, 139 (06) :1751-1756
[5]   Reflection absorption infrared spectra of thin solid films. Molecular orientation and film structure [J].
Antunes, PA ;
Constantino, CJL ;
Aroca, R ;
Duff, J .
APPLIED SPECTROSCOPY, 2001, 55 (10) :1341-1346
[6]   On the Role of Fresnel Factors in Sum-Frequency Generation Spectroscopy of Metal-Water and Metal-Oxide-Water Interfaces [J].
Backus, Ellen H. G. ;
Garcia-Araez, Nuria ;
Bonn, Mischa ;
Bakker, Huib J. .
JOURNAL OF PHYSICAL CHEMISTRY C, 2012, 116 (44) :23351-23361
[7]   SUM-FREQUENCY VIBRATIONAL SPECTROSCOPY OF THE SOLID-LIQUID INTERFACE [J].
BAIN, CD .
JOURNAL OF THE CHEMICAL SOCIETY-FARADAY TRANSACTIONS, 1995, 91 (09) :1281-1296
[8]  
Bass M., 2009, Handbook of Optics, Third Edition Volume I: Geometrical and Physical Optics, Polarized Light, Components and Instruments(set)
[9]  
Boyd R. W., 2008, Nonlinear Optics, V3rd
[10]   Energy-Level Alignment at Organic/Metal and Organic/Organic Interfaces [J].
Braun, Slawomir ;
Salaneck, William R. ;
Fahlman, Mats .
ADVANCED MATERIALS, 2009, 21 (14-15) :1450-1472