Specular X-ray reflectivity study of interfacial SiO2 layer in thermally annealed NiO/Si assembly

Present report details an analysis of X-ray reflectivity (XRR) for solution processed NiO thin films on Si (100) substrates. The films were annealed at 700-1,000 degrees C for 1 h in air. XRR data indicated growth of SiO2 layer from similar to 8 nm at 700 degrees C to similar to 66 nm at 1,000 degrees C along with significant variation of electron density profile. X-ray photoelectron spectroscopy and X-ray diffraction studies were used as supporting studies for phase purity and oxidation states of the NiO thin films as well as interfacial SiO2 layer.