Constructive Use of Process Variations: Reconfigurable and High-Resolution Delay-Line

被引:0
|
作者
Wang, Wenhao [1 ]
Luo, Yukui [1 ]
Xu, Xiaolin [1 ]
机构
[1] Northeastern Univ, Boston, MA 02115 USA
关键词
Delay-line; sub-picosecond; machine learning; DESIGN; NM;
D O I
10.23919/DATE51398.2021.9473969
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
Delay-line is a critical circuit component for highspeed electronic design and testing, such as high-performance FPGA and ASICs, to provide timing signals of specific duration or duty cycle. However, the performance of existing CMOS-based delay-lines is limited by various practical issues. For example, the minimum propagation delay (resolution) of CMOS gates is limited by the process variations from circuit fabrication. This paper presents a novel delay-line scheme, which instead of mitigating the process variations from circuit fabrication, constructively leverages them to generate time signals of specific duration. Moreover, the resolution of the proposed delay-line method is reconfigurable, for which we propose a Machine Learning modeling method to assist such reconfiguration, i.e., to generate time duration of different scales. The performance of the proposed delay-line is validated with HSpice simulation and prototype on a Xilinx Virtex-6 FPGA evaluation kit. The experimental results demonstrate that the proposed delay-line method achieves an ultra-high resolution of sub-picosecond.
引用
收藏
页码:392 / 395
页数:4
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