Processing of X-ray diffraction data in structure investigations of amorphous metal oxides

被引：3

作者：

Bataronov, IL ^{[1
]}

Posmet'yev, VV ^{[1
]}

Barmin, YV ^{[1
]}

机构：

[1] Voronezh State Tech Univ, Dept Solid State Phys, Voronezh 394026, Russia

来源：

FERROELECTRICS | 2004年 / 307卷

基金：

俄罗斯基础研究基金会;

关键词：

metal oxides; amorphous; X-ray diffraction; atomic structure; structure factor; radial distribution function;

D O I：

10.1080/00150190490493087

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The usual algorithm of the structure factor calculation, which is widely used for amorphous metals and amorphous semiconductors, cannot be applied to a number of amorphous metal oxides. Instead, we have developed a new algorithm based on the middle line method. It uses analytical properties of the structure factor and radial distribution function. The method has been applied to amorphous PbPO3.

引用

页码：191 / 197

页数：7

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