X-ray Intensity Fluctuation Spectroscopy Using Nanofocused Hard X-rays: Its Application to Study of Relaxor Ferroelectrics

被引：3

作者：

Ohwada, Kenji ^{[1
,7
]}

Namikawa, Kazumichi ^{[2
,7
]}

Shimomura, Susumu ^{[3
]}

Nakao, Hironori ^{[4
]}

Mimura, Hidekazu ^{[5
]}

Yamauchi, Kazuto ^{[5
]}

Matsushita, Mitsuyoshi ^{[6
,7
]}

Mizuki, Jun'ichiro ^{[1
,7
]}

机构：

[1] Japan Atom Energy Agcy, Quantum Beam Sci Directorate, Sayo, Hyogo 6795148, Japan

[2] Tokyo Gakugei Univ, Tokyo 1848501, Japan

[3] Keio Univ, Fac Sci & Technol, Yokohama, Kanagawa 2238522, Japan

[4] High Energy Accelerator Res Org, Inst Mat Struct Sci, Photon Factory, Tsukuba, Ibaraki 3050801, Japan

[5] Osaka Univ, Grad Sch Engn, Dept Precis Sci & Technol, Osaka 5650871, Japan

[6] JFE Mineral Co Ltd, Res Labs, Funct Mat Dev Ctr, Chiba 2600826, Japan

[7] Japan Sci & Technol Agcy, CREST, Kawaguchi, Saitama 3320012, Japan

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS | 2010年 / 49卷 / 02期

关键词：

SINGLE-CRYSTALS; PIEZOELECTRIC PROPERTIES; DOMAIN; SYSTEM; MIRRORS;

D O I：

10.1143/JJAP.49.020216

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The use of a combination of coherent X-rays from a third-generation synchrotron light source and ultraprecise Kirkpatrick-Baez mirrors enables us to apply nanofocused hard X-rays in solid-state physics. We developed an apparatus for X-ray intensity fluctuation spectroscopy using the nanofocused hard X-rays and applied it to the study of relaxor ferroelectrics. We have successfully detected a large and slow intensity fluctuation of scattered X-rays above cubic-to-tetragonal phase transition temperature with a characteristic time scale on the order of 10 s. We speculated that the intensity fluctuation originates from domain number fluctuation, which is directly related to the dielectric response, particularly the frequency dispersion. (C) 2010 The Japan Society of Applied Physics

引用

页数：3

共 21 条

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