Simultaneous resonant x-ray diffraction measurement of polarization inversion and lattice strain in polycrystalline ferroelectrics

被引：39

作者：

Gorfman, S. ^{[1
]}

Simons, H. ^{[2
,3
]}

Iamsasri, T. ^{[4
]}

Prasertpalichat, S. ^{[5
]}

Cann, D. P. ^{[5
]}

Choe, H. ^{[1
]}

Pietsch, U. ^{[1
]}

Watier, Y. ^{[2
]}

Jones, J. L. ^{[4
]}

机构：

[1] Univ Siegen, Dept Phys, D-57072 Siegen, Germany

[2] European Synchrotron Radiat Facil, BP 220, F-38043 Grenoble, France

[3] Tech Univ Denmark, Dept Phys, DK-2800 Lyngby, Denmark

[4] N Carolina State Univ, Dept Mat Sci & Engn, Box 7907, Raleigh, NC 27695 USA

[5] Oregon State Univ, Sch Mech Ind & Mfg Engn, Mat Sci, Corvallis, OR 97331 USA

来源：

SCIENTIFIC REPORTS | 2016年 / 6卷

基金：

美国国家科学基金会;

关键词：

PIEZOELECTRIC PROPERTIES; RELAXOR FERROELECTRICS; ELECTRIC-FIELD; CRYSTALLOGRAPHY; SCATTERING; CERAMICS; TITANATE; CRYSTAL;

D O I：

10.1038/srep20829

中图分类号：

O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

Structure-property relationships in ferroelectrics extend over several length scales from the individual unit cell to the macroscopic device, and with dynamics spanning a broad temporal domain. Characterizing the multi-scale structural origin of electric field-induced polarization reversal and strain in ferroelectrics is an ongoing challenge that so far has obscured its fundamental behaviour. By utilizing small intensity differences between Friedel pairs due to resonant scattering, we demonstrate a time-resolved X-ray diffraction technique for directly and simultaneously measuring both lattice strain and, for the first time, polarization reversal during in-situ electrical perturbation. This technique is demonstrated for BaTiO3-BiZn0.5Ti0.5O3 (BT-BZT) polycrystalline ferroelectrics, a prototypical lead-free piezoelectric with an ambiguous switching mechanism. This combines the benefits of spectroscopic and diffraction-based measurements into a single and robust technique with time resolution down to the ns scale, opening a new door to in-situ structure-property characterization that probes the full extent of the ferroelectric behaviour.

引用

页数：9