Temperature dependence of the thermal properties of optical memory materials

We have measured the temperature dependence of the thermal conductivities of Ge2Sb2Te5 (GST) and ZnS-SiO2 using a nano second thermoreflectance measurement system from room temperature to 500-600 degrees C. The specific heat capacities of these materials also have been determined from - 130 to 500 degrees C for GST and from room temperature to 600 degrees C for ZnS-SiO2. The Debye temperature was obtained from specific heat capacity measurement. Using the obtained temperature dependence of the thermal conductivities, a temperature simulation inside a simple structured optical disk with and without considering its temperature dependence was carried out, and the difference in maximum temperature was approximate 80 degrees C.