Scanning force microscopy of surface damage created by fast C60 cluster ions in CaF2 and LaF3 single crystals

被引：10
作者：
El-Said, A. S.
Aumayr, F.
Della-Negra, S.
Neumann, R.
Schwartz, K.
Toulemonde, M.
Trautmann, C.
Voss, K.-O.
机构：
[1] Vienna Univ Technol, Inst Allgemeine Phys, A-1040 Vienna, Austria
[2] CNRS, IN2P3, Inst Phys Nucl, F-91406 Orsay, France
[3] Gesell Schwerionenforsch mbH, D-64291 Darmstadt, Germany
[4] Ctr Interdisciplinaire Rech Ions Laser, F-14070 Caen, France
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 2007年 / 256卷 / 01期
关键词：
SFM; C-60; clusters; CaF2; LaF3; electronic energy loss;
D O I：
10.1016/j.nimb.2006.12.025
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
Single crystals of CaF2 and LaF3 were exposed to 30-MeV C-60 clusters from the tandem accelerator in Orsay, extending earlier irradiation experiments with monoatomic swift heavy ions to larger energy loss values. The irradiated crystal surfaces were investigated by scanning force microscopy (SFM) in contact mode. Topographic images reveal nanometric hillock-like structures protruding from the surface at each cluster impact site. The hillock diameter and height are analyzed and compared to monoatomic projectiles. (c) 2006 Elsevier B.V. All rights reserved.
引用
收藏
页码：313 / 318
页数：6
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