Transverse relaxation determination based on light polarization modulation for spin-exchange relaxation free atomic magnetometer

被引：5

作者：

Liu, Xue-Jing ^{[1
]}

Ding, Ming ^{[1
]}

Li, Yang ^{[1
]}

Hu, Yan-Hui ^{[1
]}

Jin, Wei ^{[2
]}

Fang, Jian-Cheng ^{[1
]}

机构：

[1] Beihang Univ, Sch Instrumentat Sci & Optoelect Engn, Beijing 100191, Peoples R China

[2] Hong Kong Polytech Univ, Dept Elect Engn, Kowloon, Hong Kong, Peoples R China

来源：

CHINESE PHYSICS B | 2018年 / 27卷 / 07期

基金：

中国国家自然科学基金;

关键词：

spin-exchange relaxation free (SERF) magnetometer; linewidth; optical polarization modulation;

D O I：

10.1088/1674-1056/27/7/073201

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

A transverse relaxation determination of spin-exchange relaxation free (SERF) magnetometer based on polarization modulation technique is proposed. Compared with the radio-frequency (RF) excitation and light intensity excitation methods used in SERF magnetometer, the light polarization modulation method has a high stability in low-frequency range, which indicates a more accurate transverse relaxation measurement.

引用

页数：5

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