Structural and magnetic properties of transition metal doped ZnO films

被引：17

作者：

Jin, C. G. ^{[1
,2
]}

Gao, Y. ^{[4
]}

Wu, X. M. ^{[1
,2
]}

Cui, M. L. ^{[1
,2
]}

Zhuge, L. J. ^{[2
,3
]}

Chen, Z. C. ^{[1
,2
]}

Hong, B. ^{[1
,2
]}

机构：

[1] Suzhou Univ, Dept Phys, Suzhou 215006, Peoples R China

[2] Suzhou Univ, Key Lab Thin Films Jiangsu, Suzhou 215006, Peoples R China

[3] Suzhou Univ, Anal & Testing Ctr, Suzhou 215006, Peoples R China

[4] Shandong Coll Elect Technol, Jinan 250014, Peoples R China

来源：

THIN SOLID FILMS | 2010年 / 518卷 / 08期

基金：

中国国家自然科学基金;

关键词：

Zinc Oxide; Thin Films; ZnO:metal; Ferromagnetism; X-ray Diffraction; Sputtering; FERROMAGNETIC PROPERTIES; OPTICAL-PROPERTIES; SEMICONDUCTOR; ORIGIN; TEMPERATURE; ADSORPTION; CHROMIUM;

D O I：

10.1016/j.tsf.2009.09.047

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Structural and magnetic properties have been studied for polycrystalline Zn1-xTMxO films where transition metal (TM) = Fe, Cr. The Zn1-xTMxO films were prepared by the radio frequency magnetron sputtering technique on Al2O3 (001) substrates. The microstructures of the films are characterized by X-ray diffraction and X-ray photoelectron spectroscopy. TM in the films exists mainly in the form of TM2+, and the TM2+ ions have substituted for the Zn2+ ions bonded in TWO in the ZnO lattice and do not change the wurtzite structure of ZnO. The result of magnetic measurement shows that the Zn1-xTMxO films are ferromagnetic at 5 K and 300 K respectively. Subsequently, we discuss the origin of the ferromagnetism in the films. (C) 2009 Elsevier B.V. All rights reserved.

引用

页码：2152 / 2156

页数：5

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