X-ray sensitivity of Cd0.9Zn0.1Te detectors

被引：75

作者：

Dvoryankin, V. F. ^{[1
]}

Dvoryankina, G. G. ^{[1
]}

Kudryashov, A. A. ^{[1
]}

Petrov, A. G. ^{[1
]}

Golyshev, V. D. ^{[2
]}

Bykova, S. V. ^{[2
]}

机构：

[1] Russian Acad Sci, Fryazino Div, Kotelnikov Inst Radio Engn & Elect, Fryazino 141190, Moscow Oblast, Russia

[2] OOO Granit A, Aleksandrov 601655, Vladimir Oblast, Russia

来源：

TECHNICAL PHYSICS | 2010年 / 55卷 / 02期

关键词：

Bias Voltage; Chloroauric Acid; High Bias Voltage; Photoelec Trons; Axial Heat Flux;

D O I：

10.1134/S1063784210020246

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The X-ray sensitivity of Cd0.9Zn0.1Te detectors as a function of the effective X-ray energy and bias voltage is studied. It is shown that the sensitivity grows with effective X-ray energy and much more significantly with bias voltage. The sensitivity depends on the angle the X-ray beam makes with an electric field in the detector. In the energy range 28-72 keV, the sensitivity is the highest when the X-ray beam is normal to the electric field in the detector.

引用

页码：306 / 308

页数：3

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