Tangential hard x-ray diagnostic array on the EXL-50 spherical tokamak

被引:15
作者
Cheng, S. K. [1 ,2 ]
Zhu, Y. B. [1 ,2 ]
Chen, Z. Y. [3 ]
Li, Y. X. [1 ,2 ]
Bai, R. H. [1 ,2 ]
Chen, B. [1 ,2 ]
Huang, X. L. [1 ,2 ]
Dai, L. L. [1 ,2 ]
Liu, M. S. [1 ,2 ]
机构
[1] Hebei Key Lab Compact Fus, Langfang 065001, Hebei, Peoples R China
[2] ENN Sci & Technol Dev Co Ltd, Langfang 065001, Hebei, Peoples R China
[3] Huazhong Univ Sci & Technol, Sch Elect & Elect Engn, State Key Lab Adv Elect Engn & Technol, Int Joint Res Lab Magnet Confinement Fus & Plasma, Wuhan 430074, Peoples R China
关键词
Electron temperature - II-VI semiconductors - Electron emission - Cadmium alloys - Cyclotrons - Plasma diagnostics - Semiconductor alloys - Spectroscopy - Electron cyclotron resonance - Magnetoplasma - Zinc alloys - Tokamak devices;
D O I
10.1063/5.0040636
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A tangential hard x-ray (HXR) diagnostic on the newly constructed ENN XuanLong-50 (EXL-50) spherical tokamak for fast electron emission studies is presented. The HXR detection system consists of a symmetrical CdZnTe semiconductor detector array with a spectral sensitivity range of 20-300 keV. 25 channels have been designed on the 270 degrees horizontal vacuum port with 12 sight lines to observe the forward emission, 12 sight lines to observe the backward emission of fast electrons, and 1 for viewing the central. Currently, ten channels have been in operation in the EXL-50 experiments. The systems are designed to measure the x-ray spectra for the estimation of fast electron temperature and electron velocity distribution in the EXL-50 experiment, which will be useful for understanding the dynamics of fast electrons generated by electron cyclotron resonance heating, for plasma instability and transport studies and for the analysis of plasma heating efficiency.
引用
收藏
页数:5
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