Prediction of stress-strain relationship with an improved Anand constitutive model for lead-free solder Sn-3.5Ag

被引:95
作者
Chen, X [1 ]
Chen, G
Sakane, M
机构
[1] Tianjin Univ, Sch Chem Engn & Technol, Tianjin 300072, Peoples R China
[2] Ritsumeikan Univ, Dept Mech Engn, Shiga 5208577, Japan
来源
IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES | 2005年 / 28卷 / 01期
基金
中国国家自然科学基金;
关键词
Anand model; constitutive model; lead-free; solder; Sn-3.5Ag;
D O I
10.1109/TCAPT.2004.843157
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
An improved Anand constitutive model is proposed to describe the inelastic deformation of lead-free solder Sn-3.5Ag used in solder joints of microelectronic packaging. The new model accurately predicted the overall trend of steady-state stress-strain behavior of the solder for the temperature range from 233 K to 398 K and the strain rate range from 0.005 s(-1) to 0.1 s(-1). h(0), a constant in the original Anand model, was set to a function of temperature and strain rate in the proposed model. Comparison of the experimental results and simulated results verified that the improved Anand model with modifying h(0) to a function reasonably simulated the inelastic stress-strain relationships.
引用
收藏
页码:111 / 116
页数:6
相关论文
共 19 条
[1]  
Anand L., 1985, International Journal of Plasticity, V1, P213, DOI 10.1016/0749-6419(85)90004-X
[2]   The necessity of reexamining previous life prediction analyses of solder joints in electronic packages [J].
Anderson, T ;
Guven, I ;
Madenci, E ;
Gustafsson, G .
IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES, 2000, 23 (03) :516-520
[3]   AN INTERNAL VARIABLE CONSTITUTIVE MODEL FOR HOT-WORKING OF METALS [J].
BROWN, SB ;
KIM, KH ;
ANAND, L .
INTERNATIONAL JOURNAL OF PLASTICITY, 1989, 5 (02) :95-130
[4]   A VISCOPLASTIC CONSTITUTIVE MODEL FOR 60/40 TIN-LEAD SOLDER USED IN IC PACKAGE JOINTS [J].
BUSSO, EP ;
KITANO, M ;
KUMAZAWA, T .
JOURNAL OF ENGINEERING MATERIALS AND TECHNOLOGY-TRANSACTIONS OF THE ASME, 1992, 114 (03) :331-337
[5]   An effective methodology for thermal characterization of electronic packaging [J].
Chen, WH ;
Cheng, HC ;
Shen, HA .
IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES, 2003, 26 (01) :222-232
[6]   Parametric reliability analysis of no-underfill flip chip package [J].
Chiang, KN ;
Liu, ZN ;
Peng, CT .
IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES, 2001, 24 (04) :635-640
[7]   CONSTITUTIVE RELATIONS FOR TIN-BASED SOLDER JOINTS [J].
DARVEAUX, R ;
BANERJI, K .
IEEE TRANSACTIONS ON COMPONENTS HYBRIDS AND MANUFACTURING TECHNOLOGY, 1992, 15 (06) :1013-1024
[8]   DEFORMATION OF PB-SN EUTECTIC ALLOYS AT RELATIVELY HIGH-STRAIN RATES [J].
GRIVAS, D ;
MURTY, KL ;
MORRIS, JW .
ACTA METALLURGICA, 1979, 27 (05) :731-737
[9]  
IGARI T, 2001, FACTUAL DATABASE TEN
[10]   Sensitivity study of temperature and strain rate dependent properties on solder joint fatigue life [J].
Pang, HLJ ;
Wang, YP ;
Shi, XQ ;
Wang, ZP .
2ND ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE, PROCEEDINGS, 1998, :184-189