Prediction of stress-strain relationship with an improved Anand constitutive model for lead-free solder Sn-3.5Ag

被引:92
作者
Chen, X [1 ]
Chen, G
Sakane, M
机构
[1] Tianjin Univ, Sch Chem Engn & Technol, Tianjin 300072, Peoples R China
[2] Ritsumeikan Univ, Dept Mech Engn, Shiga 5208577, Japan
来源
IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES | 2005年 / 28卷 / 01期
基金
中国国家自然科学基金;
关键词
Anand model; constitutive model; lead-free; solder; Sn-3.5Ag;
D O I
10.1109/TCAPT.2004.843157
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
An improved Anand constitutive model is proposed to describe the inelastic deformation of lead-free solder Sn-3.5Ag used in solder joints of microelectronic packaging. The new model accurately predicted the overall trend of steady-state stress-strain behavior of the solder for the temperature range from 233 K to 398 K and the strain rate range from 0.005 s(-1) to 0.1 s(-1). h(0), a constant in the original Anand model, was set to a function of temperature and strain rate in the proposed model. Comparison of the experimental results and simulated results verified that the improved Anand model with modifying h(0) to a function reasonably simulated the inelastic stress-strain relationships.
引用
收藏
页码:111 / 116
页数:6
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