Reversible plasma switching in epitaxial BiFeO3 thin films

被引:17
|
作者
Kim, Yunseok [1 ]
Vrejoiu, Ionela [1 ]
Hesse, Dietrich [1 ]
Alexe, Marin [1 ]
机构
[1] Max Planck Inst Microstruct Phys, D-06120 Halle, Saale, Germany
关键词
annealing; bismuth compounds; epitaxial layers; ferroelectric switching; ferroelectric thin films; multiferroics; plasma materials processing;
D O I
10.1063/1.3431585
中图分类号
O59 [应用物理学];
学科分类号
摘要
Reversible plasma switching in epitaxial multiferroic BiFeO3 thin films was directly observed and analyzed using piezoresponse force microscopy. The polarization could be reversibly switched using oxygen plasma and a subsequent thermal annealing treatment in vacuum, respectively. The domain wall velocity during plasma switching, estimated to about 10(-8) m/s, is much slower compared to the normal electrical switching, however a large area of square centimeter scale could be stably switched. The results demonstrate that reversible plasma switching can be achieved by oxygen plasma treatment and it can be a useful tool for an electrode-less control of ferroelectric switching on large area. (C) 2010 American Institute of Physics. [doi: 10.1063/1.3431585]
引用
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页数:3
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