Numerical algorithm of secondary emission microwave electron gun

被引：0

作者：

Sun, HB ^{[1
]}

Pei, YJ ^{[1
]}

Xie, AG ^{[1
]}

Wang, R ^{[1
]}

机构：

[1] Univ Sci & Technol China, Natl Synchrotron Radiat Lab, Hefei 230029, Peoples R China

来源：

HIGH ENERGY PHYSICS AND NUCLEAR PHYSICS-CHINESE EDITION | 2005年 / 29卷 / 01期

关键词：

electron movement; space charge effect; multi-grid; Runge-Kutta method; secondary emission; microwave electron gun;

D O I：

暂无

中图分类号：

O57 [原子核物理学、高能物理学];

学科分类号：

070202 ;

摘要：

A tracking algorithm using grid-based space charge fields is studied for the analysis of secondary emission microwave electron gun(SEMEG). The poisson equations of the space charge forces are determined in the hunch's rest frame with a multi-grid method. The particles' equations of motion are solved with a fifth-order embedded Runge-Kutta method. The results of the SEMEG by this algorithm are presented and compared with these by Mafia algorithm.

引用

页码：95 / 98

页数：4

共 12 条

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