Improved two-dimensional product imaging: The real-time ion-counting method

被引:177
作者
Chang, BY [1 ]
Hoetzlein, RC [1 ]
Mueller, JA [1 ]
Geiser, JD [1 ]
Houston, PL [1 ]
机构
[1] Cornell Univ, Dept Chem, Ithaca, NY 14853 USA
关键词
D O I
10.1063/1.1148824
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A novel ion-counting method for significantly improving the spatial resolution and detection sensitivity of two-dimensional product imaging in molecular beam experiments is presented. The method makes use of real-time digital image processing to retrieve, threshold, and determine the local maximum of each ion hitting a microchannel plate assembly. The current version can process data at rates up to 3.07 Mbyte/s, and methods for accelerating this rate are proposed. (C) 1998 American Institute of Physics.
引用
收藏
页码:1665 / 1670
页数:6
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