Evaluation and application of a fast EBSD detector

被引：4

作者：

Brough, I. ^{[1
]}

Humphreys, F. J. ^{[1
]}

机构：

[1] Univ Manchester, Sch Mat, Manchester M1 7HS, Lancs, England

来源：

MATERIALS SCIENCE AND TECHNOLOGY | 2010年 / 26卷 / 06期

关键词：

EBSD; In situ; Speed; Spatial resolution; Angular resolution; Aluminium; ELECTRON BACKSCATTER DIFFRACTION; ALUMINUM CRYSTALS; RECRYSTALLIZATION; GROWTH; TEXTURE; METALS; STEEL; GRAIN;

D O I：

10.1179/026708309X12468927349415

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A Nordlys F, fast electron backscatter diffraction camera has been used on a CamScan MX2500 field emission gun SEM in conjunction with a hot stage to study annealing phenomena in metals. The performance of the camera under a wide variety of conditions has been evaluated, and comparison is made with a conventional electron backscatter diffraction camera operating under the same conditions and with the same samples. Examples are given of applications of the system to the annealing of aluminium alloys.

引用

页码：636 / 639

页数：4

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