Identification of Multi layered Structure Properties Using Wavelet-fractal Dimension of Ultrasonic Data

被引:0
|
作者
Dun Yi [1 ]
Chen Jian-hui [1 ]
Wang Guang-long [1 ]
Shi Xiao-hong [2 ]
Xu Zhang-sui [2 ]
机构
[1] Mech Engn Coll, Missile Engn Dept, Shijiazhuang 050003, Hebei, Peoples R China
[2] Nondestruct Testing Technol Inst, Mech Engn Coll, Shijiazhuang 050003, Hebei, Peoples R China
来源
ICIA: 2009 INTERNATIONAL CONFERENCE ON INFORMATION AND AUTOMATION, VOLS 1-3 | 2009年
基金
中国国家自然科学基金;
关键词
D O I
暂无
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
This paper present a wavelet-fractal dimension approach for extracting feature from ultrasonic non-destructive evaluation (NDE) data of a test multilayer adhesive structure specimen. These features are then used to estimate the specimen's bonded quality. When the multilayer adhesive structure undergo ultrasonic NDE, echo from interior layers often overlap severely, causing information from individual layers to be obscured or lost completely. A new idea, using wavelet as the ruler to define fractal dimension, is proposed in this paper, based on self similarity of knowing essence of things from collectivity to part, from macrocosm to microcosm, in fractal theory and wavelet transform. Wavelet-fractal dimension is defined as the sum of high-frequency values of decomposed signals. The fractal characteristics of ultrasonic data are gotten from this dimension. The extracted features displayed are effective to analyze and identify the bonded properties. It is believed that the features extracted via the method outlined in this paper provide considerable promise in the area of the test of multilayered structure.
引用
收藏
页码:969 / +
页数:2
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