Electromagnetic transients simulation models for accurate representation of switching losses and thermal performance in power electronic systems

被引:151
作者
Rajapakse, AD [1 ]
Gole, AM
Wilson, PL
机构
[1] Univ Manitoba, Dept Elect & Comp Engn, Winnipeg, MB R3T 5V6, Canada
[2] Manitoba HVDC Res Ctr, Winnipeg, MB R3J 3WI, Canada
关键词
insulated-gate bipolar transistors (IGBTs); losses; power system simulation; pulse-width-modulated (PWM) power converters; semiconductor device thermal factors;
D O I
10.1109/TPWRD.2004.839726
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper presents an electrothermal model of an insulated-gate bipolar transistor (IGBT) switch suitable for the simulation of switching and conduction losses in a large class, of voltage-sourced converter (VSC)-based flexible ac transmission systems (FACTS) devices. The model is obtained by mathematical derivation of loss equations from the known submicrosecond device switching characteristics, and through the selection of appropriate differential equation parameters for representing the thermal performance. The model is useful in determining the device's heat generation, its junction temperature, as well as the cooling performance of the connected heat sinks. The model provides accurate results without recourse to an unreasonably small time step.
引用
收藏
页码:319 / 327
页数:9
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