Thin sample refractive index by transmission spectroscopy

被引:13
作者
Brindza, Michael [1 ]
Flynn, Richard A. [1 ]
Shirk, James S. [2 ]
Beadie, G. [1 ]
机构
[1] Naval Res Lab, Opt Sci Div, Washington, DC 20375 USA
[2] Sotera Def Solut Inc, Columbia, MD 21046 USA
关键词
WHITE-LIGHT INTERFEROMETRY; WAVELENGTH CALIBRATION; LENSES; SPECTROMETER; THICKNESS;
D O I
10.1364/OE.22.028537
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Transmission spectroscopy and a small number of refractometer index measurements are combined to provide refractive index measurements of transparent samples similar to 50 um thick at hundreds of wavelengths with absolute accuracies <1x10(-4). Key to the technique is the use of independent index measurements to circumvent the need for an independent thickness measurement of the sample. The method was demonstrated on glass samples where fits to Cauchy curves had RMS accuracies <3x10(-5) from 415 to 1610 nm. Issues that must be addressed to reach this level of accuracy are discussed. (C) 2014 Optical Society of America
引用
收藏
页码:28537 / 28552
页数:16
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