Magnetic force microscopy study in patterned permalloy submicron-wires

被引：0

作者：

Huang, E. W. ^{[1
]}

Yu, C. ^{[1
]}

Lee, S. F. ^{[1
]}

Yao, Y. D. ^{[1
]}

Chen, T. Y. ^{[1
]}

Wong, M. S. ^{[1
]}

Chang, C. R. ^{[1
]}

Han, B. S. ^{[1
]}

Ma, Y. R. ^{[1
]}

机构：

[1] Acad Sinica, Inst Phys, Taipei 115, Taiwan

来源：

International Journal of Nanoscience, Vol 2, Nos 4 and 5 | 2003年 / 2卷 / 4-5期

关键词：

magnetic force microscopy; magnetoresistance; domain;

D O I：

10.1142/S0219581X03001358

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

Advances in real-time magnetic force microscopy (MFM) permit, us to directly observe the domain structures under magnetic field, which enable us to understand magnetic phenomena in nanostructure with controlled shapes. Magnetoresistance change is a complementary way to understand the magnetization reversal process, e.g., domain wall formation and annihilation. Using systematic pattern design, we arrange Permalloy octagons in chains to study the associated domain configurations inferred from real-time MFM and MR loop.

引用

页码：325 / 333

页数：9

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