X-ray photoelectron and Auger electron spectroscopy (Reprinted from Analytical Instrumentation Handbook, Second Edition, Revised and Expanded, pg 863, 1997)

被引：11
作者：
Turner, NH [1 ]
机构：
[1] USN, Res Lab, Washington, DC 20375 USA
来源：
APPLIED SPECTROSCOPY REVIEWS | 2000年 / 35卷 / 03期
关键词：
D O I：
10.1081/ASR-100101225
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：203 / 254
页数：52
相关论文
共 135 条
[1]  
ANDERSON HH, 1981, SPUTTERING PARTICLE, V1, P72
[2]  
[Anonymous], METHODS SURFACE ANAL
[3]   XPS - ENERGY CALIBRATION OF ELECTRON SPECTROMETERS .1. AN ABSOLUTE, TRACEABLE ENERGY CALIBRATION AND THE PROVISION OF ATOMIC REFERENCE LINE ENERGIES [J].
ANTHONY, MT ;
SEAH, MP .
SURFACE AND INTERFACE ANALYSIS, 1984, 6 (03) :95-106
[4]   XPS - ENERGY CALIBRATION OF ELECTRON SPECTROMETERS .2. RESULTS OF AN INTERLABORATORY COMPARISON [J].
ANTHONY, MT ;
SEAH, MP .
SURFACE AND INTERFACE ANALYSIS, 1984, 6 (03) :107-115
[5]   ELECTRON INELASTIC MEAN FREE PATHS IN SEVERAL SOLIDS FOR 200 EV LESS-THAN-OR-EQUAL-TO E LESS-THAN-OR-EQUAL-TO 10 KEV [J].
ASHLEY, JC ;
TUNG, CJ .
SURFACE AND INTERFACE ANALYSIS, 1982, 4 (02) :52-55
[6]  
*ASTM, 1991, SURF INTERFACE ANAL, V17, P951
[7]   ATTENUATION LENGTHS OF PHOTOELECTRONS IN HYDROCARBON FILMS [J].
BAIN, CD ;
WHITESIDES, GM .
JOURNAL OF PHYSICAL CHEMISTRY, 1989, 93 (04) :1670-1673
[8]   TESTING THE SUCCESS OF ANALYTICAL IMAGE CORRECTION ROUTINES - SURFACE IMAGES [J].
BARKSHIRE, IR ;
WALTON, JM ;
PRUTTON, M .
SURFACE AND INTERFACE ANALYSIS, 1993, 20 (07) :583-588
[9]  
Barr T. L., 1994, MODERN ESCA PRINCIPL
[10]   STUDIES IN DIFFERENTIAL CHARGING [J].
BARR, TL .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1989, 7 (03) :1677-1683
12345678910