Mechanisms underlying strong-field double ionization of argon dimers

被引：56

作者：

Manschwetus, B. ^{[1
]}

Rottke, H. ^{[1
]}

Steinmeyer, G. ^{[1
]}

Foucar, L. ^{[2
]}

Czasch, A. ^{[3
]}

Schmidt-Boecking, H. ^{[3
]}

Sandner, W. ^{[1
]}

机构：

[1] Max Born Inst, D-12489 Berlin, Germany

[2] Ctr Free Electron Laser Sci, Max Planck Adv Study Grp, D-22607 Hamburg, Germany

[3] Goethe Univ Frankfurt, Inst Kernphys, D-60438 Frankfurt, Germany

来源：

PHYSICAL REVIEW A | 2010年 / 82卷 / 01期

关键词：

ULTRAFAST CHARGE MIGRATION; MOMENTUM DISTRIBUTIONS; ELECTRONIC STATES; RECOIL-ION; CURVES;

D O I：

10.1103/PhysRevA.82.013413

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We investigate double ionization of argon dimers in high-intensity ultrashort Ti:sapphire laser pulses. We are able to identify several strong-field excitation pathways of the dimer that terminate in atomic ion pairs from a Coulomb explosion. The explosion starts from two-site double-ionized dimers and from one-site double-ionized ones after radiative charge transfer at small internuclear separation. One-site double ionization is accomplished by laser-induced charge transfer in the high-intensity laser pulse following two-site double ionization. The highest energy ion pairs we observed can be attributed to "frustrated triple ionization" of the argon dimer.

引用

页数：9

共 30 条

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