The adsorption of Ag3Sn nano-particles on Cu-Sn intermetallic compounds of Sn-3Ag-0.5Cu/Cu during soldering

被引:65
作者
Liu, Xiaoying [1 ]
Huang, Mingliang [1 ]
Zhao, Yanhui [1 ]
Wu, C. M. L. [2 ]
Wang, Lai [1 ]
机构
[1] Dalian Univ Technol, Dept Mat Engn, Dalian 116024, Liaoning, Peoples R China
[2] City Univ Hong Kong, Dept Phys & Mat Sci, Hong Kong, Hong Kong, Peoples R China
关键词
Sn-3Ag-0.5Cu; Cu6Sn5; Ag3Sn; Intermetallic compound (IMC); Adsorption; MICROSTRUCTURAL EVOLUTION; TENSILE PROPERTIES; MOLTEN SN; AG; ALLOYS; JOINTS; TECHNOLOGY; ADDITIONS; GROWTH;
D O I
10.1016/j.jallcom.2009.11.131
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The interfacial reactions between Sn-3Ag-0.5Cu solder and Cu substrate at 250 degrees C and 300 degrees C from 30s up to 1800s were investigated. The average size of the Ag3Sn nano-particles adsorbed on the Cu6Sn5 intermetallic compounds as a function of soldering temperature and time were studied. The results show that the adsorption of Ag3Sn particles occurs during solidification process and the number of Ag3Sn particles increases with the morphology changing of Cu6Sn5 intermetallic compounds. When soldering at a fixed temperature, the average sizes of the Ag3Sn nano-particles are almost the same with the different soldering durations. However, the Ag3Sn nano-particles observed on intermetallic compounds are smaller at 300 degrees C than those at 250 degrees C. The Ag3Sn particles arrange in line in the same plane and the arrangements of Ag3Sn lines order two perpendicular orientations, but there are no relationship with the Cu6Sn5 surface orientations. (C) 2009 Elsevier B.V. All rights reserved.
引用
收藏
页码:433 / 438
页数:6
相关论文
共 26 条
  • [1] Microstructural modifications and properties of Sn-Ag-Cu solder joints induced by alloying
    Anderson, IE
    Cook, BA
    Harringa, J
    Terpstra, RL
    [J]. JOURNAL OF ELECTRONIC MATERIALS, 2002, 31 (11) : 1166 - 1174
  • [2] The microstructure parameters and microhardness of directionally solidified Sn-Ag-Cu eutectic alloy
    Boyuk, U.
    Marasli, N.
    [J]. JOURNAL OF ALLOYS AND COMPOUNDS, 2009, 485 (1-2) : 264 - 269
  • [3] CUI YP, 2009, 2009 INT C EL PACK T, P593
  • [4] Pb-free solders for flip-chip interconnects
    Frear, DR
    Jang, JW
    Lin, JK
    Zhang, C
    [J]. JOM-JOURNAL OF THE MINERALS METALS & MATERIALS SOCIETY, 2001, 53 (06): : 28 - +
  • [5] Growth of η phase scallops and whiskers in liquid tin-solid copper reaction couples
    Gagliano, RA
    Fine, ME
    [J]. JOM-JOURNAL OF THE MINERALS METALS & MATERIALS SOCIETY, 2001, 53 (06): : 33 - 38
  • [6] Evaluation of creep behavior of near-eutectic Sn-Ag solders containing small amount of alloy additions
    Guo, F
    Choi, S
    Subramanian, KN
    Bieler, TR
    Lucas, JP
    Achari, A
    Paruchuri, M
    [J]. MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2003, 351 (1-2): : 190 - 199
  • [7] Effects of intermetallic compounds on properties of Sn-Ag-Cu lead-free soldered joints
    Kim, KS
    Huh, SH
    Suganuma, K
    [J]. JOURNAL OF ALLOYS AND COMPOUNDS, 2003, 352 (1-2) : 226 - 236
  • [8] Effects of cooling speed on microstructure and tensile properties of Sn-Ag-Cu alloys
    Kim, KS
    Huh, SH
    Suganuma, K
    [J]. MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2002, 333 (1-2): : 106 - 114
  • [9] LEE HT, 2009, 2009 INT C EL PACK T, P646
  • [10] Preparation of Sn-3.5Ag nano-solder by supernatant process
    Lin, C. Y.
    Chou, J. H.
    Lee, Y. G.
    Mohanty, U. S.
    [J]. JOURNAL OF ALLOYS AND COMPOUNDS, 2009, 470 (1-2) : 328 - 331