Cluster analysis of soft X-ray spectromicroscopy data

被引：10
|
作者：
Jacobsen, C [1 ]
Feser, M
Lerotic, M
Vogt, S
Maser, J
Schäfer, T
机构：
[1] SUNY Stony Brook, Dept Phys & Astron, Stony Brook, NY 11794 USA
[2] Argonne Natl Lab, Adv Photon Source, Argonne, IL 60439 USA
[3] Forschungszentrum Karlsruhe, D-76021 Karlsruhe, Germany
来源：
JOURNAL DE PHYSIQUE IV | 2003年 / 104卷
关键词：
D O I：
10.1051/jp4:20030157
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
We describe the use of principle component analysis (PCA) to serve as a prefilter for cluster analysis or pattern recognition analysis of soft x-ray spectromicroscopy data. Cluster analysis provides a method to group regions with common spectral features even if no prior knowledge of their spectra is available, such as in biology or environmental science.
引用
收藏
页码：623 / 626
页数：4
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