Simulation of scanning transmission electron microscope images on desktop computers

被引：72

作者：

Dwyer, C. ^{[1
]}

机构：

[1] Monash Univ, Monash Ctr Elect Microscopy, Dept Mat Engn, Clayton, Vic 3800, Australia

来源：

ULTRAMICROSCOPY | 2010年 / 110卷 / 03期

关键词：

STEM; Image simulation; Multislice; PRACTICAL APPROACH; MULTISLICE; SCATTERING; CONTRAST;

D O I：

10.1016/j.ultramic.2009.11.009

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

Two independent strategies are presented for reducing the computation time of multislice simulations of scanning transmission electron microscope (STEM) images: (1) optimal probe sampling, and (2) the use of desktop graphics processing units. The first strategy is applicable to STEM images generated by elastic and/or inelastic scattering, and requires minimal effort for its implementation. Used together, these two strategies can reduce typical computation times from days to hours, allowing practical simulation of STEM images of general atomic structures on a desktop computer. (C) 2009 Elsevier B.V. All rights reserved.

引用

页码：195 / 198

页数：4

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