Growth and characterization of Cu2ZnSnS4 and Cu2ZnSnSe4 thin films for photovoltaic applications

被引:0
作者
Friedlmeier, TM
Dittrich, H
Schock, HW
机构
[1] Univ Stuttgart, Inst Phys Elekt, D-70569 Stuttgart, Germany
[2] Zentrum Sonnenenergie & Wasserstoff Forsch, D-70565 Stuttgart, Germany
来源
TERNARY AND MULTINARY COMPOUNDS | 1998年 / 152卷
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D O I
暂无
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
The quaternary compounds Cu2ZnSnS4 and Cu2ZnSnSe4 crystallize in the kesterite structure and they are interesting for thin-film solar cell devices. We describe the growth and characterization of kesterite-type thin films synthesized by thermal evaporation of the elements and binary chalcogenides in high vacuum. The film composition and grain size depend to a large extent on the substrate temperature. X-ray diffraction analysis indicates formation of the ordered kesterite structure. A copper-tin chalcogenide is the only ternary compound found in this quaternary system. The resistivity of KCN-etched films ranges between 1 and 100 Omega cm for Zn-rich films, and it varies greatly for Sn-rich films.
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页码:345 / 348
页数:4
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