Magnetic characterization of CoFeB/MgO and CoFe/MgO interfaces

被引:13
作者
Negusse, Ezana [1 ]
Lussier, A.
Dvorak, J.
Idzerda, Y. U.
Shinde, S. R.
Nagamine, Y.
Furukawa, S.
Tsunekawa, K.
Djayaprawira, D. D.
机构
[1] Montana State Univ, Dept Phys, Bozeman, MT 59717 USA
[2] Canon ANELVA Corp, San Jose, CA 95134 USA
关键词
D O I
10.1063/1.2709619
中图分类号
O59 [应用物理学];
学科分类号
摘要
The use of CoFeB ferromagnetic electrodes in place of CoFe has been shown to significantly increase the tunneling magnetoresistance (TMR) of MgO based magnetic tunnel junctions (MTJs). By using soft x-ray scattering techniques, we show that the behavior of the magnetic moments located at the CoFe-MgO interface are drastically different from the rest of the CoFe film, whereas the magnetic response of the CoFeB-MgO interfacial moments is coherent with the film's bulk. Our results support the view that the high TMR values observed in MgO based MTJs with CoFeB electrodes are due to the uniform magnetic response of the entire CoFeB electrode including the MgO interfacial moments. (c) 2007 American Institute of Physics.
引用
收藏
页数:3
相关论文
共 19 条
[1]   Spin-dependent tunneling conductance of Fe|MgO|Fe sandwiches -: art. no. 054416 [J].
Butler, WH ;
Zhang, XG ;
Schulthess, TC ;
MacLaren, JM .
PHYSICAL REVIEW B, 2001, 63 (05)
[2]   Circular polarized soft X-ray resonant magnetic scattering studies of FeCo/Mn/FeCo multilayers [J].
Chakarian, V ;
Idzerda, YU ;
Kao, CC ;
Chen, CT .
JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 1997, 165 (1-3) :52-55
[3]   ELEMENT-SPECIFIC MAGNETIC HYSTERESIS AS A MEANS FOR STUDYING HETEROMAGNETIC MULTILAYERS [J].
CHEN, CT ;
IDZERDA, YU ;
LIN, HJ ;
MEIGS, G ;
CHAIKEN, A ;
PRINZ, GA ;
HO, GH .
PHYSICAL REVIEW B, 1993, 48 (01) :642-645
[4]   230% room-temperature magnetoresistance in CoFeB/MgO/CoFeB magnetic tunnel junctions [J].
Djayaprawira, DD ;
Tsunekawa, K ;
Nagai, M ;
Maehara, H ;
Yamagata, S ;
Watanabe, N ;
Yuasa, S ;
Suzuki, Y ;
Ando, K .
APPLIED PHYSICS LETTERS, 2005, 86 (09) :1-3
[5]   Identifying layer switching in magnetic multilayers with x-ray resonant magnetic scattering [J].
Freeland, JW ;
Chakarian, V ;
Idzerda, YU ;
Doherty, S ;
Zhu, JG ;
Park, JH ;
Kao, CC .
APPLIED PHYSICS LETTERS, 1997, 71 (02) :276-278
[6]   Probing interfacial and bulk magnetic hysteresis in roughened CoFe thin films [J].
Freeland, JW ;
Bussmann, K ;
Lubitz, P ;
Idzerda, YU ;
Cao, CC .
APPLIED PHYSICS LETTERS, 1998, 73 (15) :2206-2208
[7]   Exploring magnetic roughness in CoFe thin films [J].
Freeland, JW ;
Chakarian, V ;
Bussmann, K ;
Idzerda, YU ;
Wende, H ;
Kao, CC .
JOURNAL OF APPLIED PHYSICS, 1998, 83 (11) :6290-6292
[8]   Development of the magnetic tunnel junction MRAM at IBM: From first junctions to a 16-Mb MRAM demonstrator chip [J].
Gallagher, WJ ;
Parkin, SSP .
IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 2006, 50 (01) :5-23
[9]   Effect of high annealing temperature on giant tunnel magnetoresistance ratio of CoFeB/MgO/CoFeB magnetic tunnel junctions [J].
Hayakawaa, J. ;
Ikeda, S. ;
Lee, Y. M. ;
Matsukura, F. ;
Ohno, H. .
APPLIED PHYSICS LETTERS, 2006, 89 (23)
[10]   MAGNETIC-STRUCTURE OF FE/CR/FE TRILAYERS [J].
IDZERDA, YU ;
TJENG, LH ;
LIN, HJ ;
GUTIERREZ, CJ ;
MEIGS, G ;
CHEN, CT .
PHYSICAL REVIEW B, 1993, 48 (06) :4144-4147