Vector memory expansion system for T33xx logic tester

被引：0

作者：

Yamada, K ^{[1
]}

Takahashi, Y ^{[1
]}

机构：

[1] IBM Japan Ltd, Semicond Test Engn, Shiga, Japan

来源：

PROCEEDINGS OF THE 11TH ASIAN TEST SYMPOSIUM (ATS 02) | 2002年

关键词：

T33XX LSSD vector pattern DFT;

D O I：

10.1109/ATS.2002.1181743

中图分类号：

TP31 [计算机软件];

学科分类号：

081202 ; 0835 ;

摘要：

This paper describes a low-cost memory expansion system for the Advantest T33XX logic tester series. Using this system, the T33XX tester has the same capability as the T6672 tester. This system will allow the T33XX to be used for ASIC wafer testing until 2010.

引用

页码：392 / 396

页数：5