Variable temperature STM studies of the adsorption of oxygen on the Si(111)-7 x 7 surface

被引:25
作者
Mayne, AJ [1 ]
Rose, F [1 ]
Comtet, G [1 ]
Hellner, L [1 ]
Dujardin, G [1 ]
机构
[1] Univ Paris 11, CNRS, Photophys Mol Lab, UPR3361, F-91405 Orsay, France
关键词
scanning tunneling microscopy; oxidation; silicon; semiconducting surfaces; adsorption kinetics;
D O I
10.1016/S0039-6028(02)02622-5
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The scanning tunnelling microscope (STM) has been used to study the adsorption at room (300 K) and low (30 K) temperature of oxygen on the Si(1 1 1)-7 x 7 surface. Subsequently, STM manipulation has been used to find out which of the observed sites can be. modified (displacement, transformation, desorption). It was found that the adsorption is quite different at 30 K compared to 300 K and that the manipulation at room temperature is essential in the identification of the sites. These results are in general agreement with recent conclusions from theoretical work [Phys. Rev. Lett. 84 (2000),1724] and synchrotron radiation experiments [Phys. Rev. B 65 (2002) 035315]. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:132 / 137
页数:6
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