Proton Irradiation Enhancement of Low-Field Negative Magnetoresistance Sensitivity of AlGaN/GaN-Based Magnetic Sensor at Cryogenic Temperature

被引:11
作者
Abderrahmane, Abdelkader [1 ]
Ko, Pil Ju [2 ]
Okada, Hiroshi [2 ]
Sato, Shin-Ichiro [3 ]
Ohshima, Takeshi [3 ]
Sandhu, Adarsh [2 ]
机构
[1] Toyohashi Univ Technol, Dept Elect & Elect Informat Engn, Toyohashi, Aichi 4418580, Japan
[2] Toyohashi Univ Technol, Elect Inspired Interdisciplinary Res Inst, Toyohashi, Aichi 4418580, Japan
[3] Japan Atom Energy Agcy, Takasaki, Gunma 3701292, Japan
关键词
AlGaN/GaN heterostructures; two-dimensional electron gas; micro-Hall sensors; proton irradiation; weak localization; magnetoresistance;
D O I
10.1109/LED.2014.2358613
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The longitudinal and transverse magnetoresistances of AlGaN/GaN heterostructure-based micro-Hall sensors were compared with samples irradiated with protons with an energy of 380 keV and fluence of 10(14) (protons/cm(2)). Increases in the elastic and inelastic scattering were deduced from weak localization behavior in both samples. The AlGaN/GaN micro-Hall sensors showed stable magnetic sensitivity in non and irradiated samples and increased resistivity after proton irradiation yielded an enhanced magnetoresistance sensitivity in nonirradiated sensors from 160 to 417 VA(-1)T(-1). The minimum detectable magnetic field of irradiated micro-Hall sensors determined from magneto-voltage measurements at similar to 4 K was similar to the minimum detectable magnetic field in the nonirradiated sensors.
引用
收藏
页码:1130 / 1132
页数:3
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