Structural And Optical Properties Of Ni Added ZnO Thin Films Deposited By Sol-Gel Method

被引：1

作者：

Murugan, R. ^{[1
]}

Vijayaprasath, G. ^{[1
]}

Mahalingam, T. ^{[2
]}

Anandhan, N. ^{[1
]}

Ravi, G. ^{[1
]}

机构：

[1] Alagappa Univ, Dept Phys, Karaikkudi 630003, Tamil Nadu, India

[2] Karunya Univ, Dept Phys, Coimbatore 641114, Tamil Nadu, India

来源：

SOLID STATE PHYSICS: PROCEEDINGS OF THE 58TH DAE SOLID STATE PHYSICS SYMPOSIUM 2013, PTS A & B | 2014年 / 1591卷

关键词：

Sol-gel method; Scanning electron microscopy; Powder diffraction;

D O I：

10.1063/1.4872803

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Pure and Ni added zinc oxide thin films were prepared by sol-gel method using spin-coating technique on glass substrates. The influences of nickel on ZnO thin films are characterized by Powder X-ray diffraction study. Pure and Ni added thin films are hexagonal wurtzite structure without any secondary phase in c-axis orientation. The SEM images of thin films show uniform sphere like particles covered completely on glass substrates. All the films exhibit transmittance of 85-95% in the visible range up to 800nm and cut-off wavelength observed at 394 nm corresponding to the fundamental absorption of ZnO. The photoluminescence property for pure and Ni added ZnO thin films has been studied and results are presented in detail.

引用

页码：922 / 924

页数：3