Nano-optical Imaging of In-Plane Homojunctions in Graphene and MoS2 van der Waals Heterostructures on Talc and SiO2

被引:17
|
作者
Gadelha, Andreij C. [1 ,2 ,3 ]
Vasconcelos, Thiago L. [4 ]
Cancado, Luiz G. [1 ]
Jorio, Ado [1 ,5 ]
机构
[1] Univ Fed Minas Gerais, Phys Dept, BR-31270901 Belo Horizonte, MG, Brazil
[2] Univ Colorado, Dept Phys, Dept Chem, Boulder, CO 80309 USA
[3] Univ Colorado, JILA, Boulder, CO 80309 USA
[4] Inst Nacl Metrol Qualidade & Tecnol Inmetro, BR-25250020 Duque De Caxias, RJ, Brazil
[5] Univ Fed Minas Gerais, Elect Engn Grad Program, BR-31270901 Belo Horizonte, MG, Brazil
来源
JOURNAL OF PHYSICAL CHEMISTRY LETTERS | 2021年 / 12卷 / 31期
关键词
P-N-JUNCTIONS; DIODES;
D O I
10.1021/acs.jpclett.1c01804
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Understanding the impact of doping variations on the physical properties of two-dimensional materials is important for their application in electronic and optoelectronic devices. Here we report a nano-optical study on graphene and MoS2 homojunctions by placing these two materials partly on top of a layered talc substrate, partly on top of an SiO2 substrate. By analyzing the nano-Raman scattering from graphene and the nanophotoluminescense emission from MoS2, two different doping zones are evident with sub-100 nm wide charge oscillations. The oscillations occur abruptly at the homojuction and extend over longer distances away from the interface, indicating imperfect deposition of the two-dimensional layer on the substrate. These results evidence fine and unexpected details of the homojuctions, important to build better electronic and optoelectronic devices.
引用
收藏
页码:7625 / 7631
页数:7
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