Low-kilovolt coherent electron diffractive imaging instrument based on a single-atom electron source

被引:3
作者
Lin, Chun-Yueh [1 ]
Chang, Wei-Tse [2 ]
Chen, Yi-Sheng [2 ]
Hwu, En-Te [2 ]
Chang, Chia-Seng [2 ]
Hwang, Ing-Shouh [2 ]
Hsu, Wei-Hao [3 ]
机构
[1] Natl Taiwan Univ, Dept Phys, Taipei 10617, Taiwan
[2] Acad Sinica, Inst Phys, Taipei 11529, Taiwan
[3] Natl Tsing Hua Univ, Dept Mat Sci & Engn, Hsinchu 30013, Taiwan
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A | 2016年 / 34卷 / 02期
关键词
PHASE RETRIEVAL; TIPS; MICROSCOPY; ALGORITHMS; STEM/TEM; KV;
D O I
10.1116/1.4938408
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
In this work, a transmission-type, low-kilovolt coherent electron diffractive imaging instrument was constructed. It comprised a single-atom field emitter, a triple-element electrostatic lens, a sample holder, and a retractable delay line detector to record the diffraction patterns at different positions behind the sample. It was designed to image materials thinner than 3 nm. The authors analyzed the asymmetric triple-element electrostatic lens for focusing the electron beams and achieved a focused beam spot of 87 nm on the sample plane at the electron energy of 2 kV. High-angle coherent diffraction patterns of a suspended graphene sample corresponding to (0.62 angstrom)(-1) were recorded. This work demonstrated the potential of coherent diffractive imaging of thin two-dimensional materials, biological molecules, and nano-objects at a voltage between 1 and 10 kV. The ultimate goal of this instrument is to achieve atomic resolution of these materials with high contrast and little radiation damage. (C) 2015 American Vacuum Society.
引用
收藏
页数:6
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