X-ray spectroscopy and imaging of Nike laser-produced plasmas

被引：0
|
作者：
Seely, JF [1 ]
Brown, CM
Feldman, U
Obenschain, S
Bodner, S
Pawley, C
Gerber, K
Sethian, J
Aglitskiy, Y
Lehecka, T
Holland, G
机构：
[1] USN, Res Lab, Washington, DC 20375 USA
[2] Sci Applicat Int Corp, Mclean, VA 22102 USA
[3] SFA Inc, Landover, MD 20785 USA
来源：
JOURNAL OF QUANTITATIVE SPECTROSCOPY & RADIATIVE TRANSFER | 1997年 / 58卷 / 4-6期
关键词：
D O I：
10.1016/S0022-4073(97)00096-4
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
Plastic foils were irradiated by the NRL Nike KrF laser and were imaged in the x-ray and extreme ultraviolet regions with 2D spatial resolution in the 3-10 mu m range. The CH foils were backlit by a silicon plasma. The silicon backlighter emission was recorded by an x-ray spectrometer, and the Si+12 1,855 eV resonance line emission was recorded by a fast x-ray diode. A spherically curved quartz crystal produced monochromatic images of the 1,865 eV radiation that was transmitted by the CH foils. Instabilities that were seeded by linear ripple patterns on the irradiated sides of CH foils were observed. The ripple patterns had periods in the 31-125 mu m range and amplitudes in the 0.25-5.0 mu m range. (C) 1997 Published by Elsevier Science Ltd. All rights reserved.
引用
收藏
页码：905 / 910
页数：6
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