TEM and STM studies of some transition-metal chalcogenides with reduced dimensionality

被引：0
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作者：
Prodan, A [1 ]
机构：
[1] Jozef Stefan Inst, SI-1000 Ljubljana, Slovenia
来源：
PROCEEDINGS OF THE 5TH MULTINATIONAL CONGRESS ON ELECTRON MICROSCOPY | 2001年
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TH742 [显微镜];
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页码：405 / 416
页数：12
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