Current status of Ga2O3 power devices

被引:192
作者
Higashiwaki, Masataka [1 ]
Murakami, Hisashi [2 ]
Kumagai, Yoshinao [2 ]
Kuramata, Akito [3 ]
机构
[1] Natl Inst Informat & Commun Technol, Koganei, Tokyo 1848795, Japan
[2] Tokyo Univ Agr & Technol, Dept Appl Chem, Koganei, Tokyo 1848588, Japan
[3] Tamura Corp, Sayama, Osaka 3501328, Japan
关键词
BETA-GA2O3; SINGLE-CRYSTALS; SCHOTTKY; GROWTH; FIELD; EDGE;
D O I
10.7567/JJAP.55.1202A1
中图分类号
O59 [应用物理学];
学科分类号
摘要
Gallium oxide (Ga2O3) is an emerging wide-bandgap semiconductor for high-power, low-loss transistors and diodes by virtue of its excellent material properties and suitability for mass production. In this paper, we begin by discussing the material properties of Ga2O3 that make it an attractive alternative to not only Si but also other wide-bandgap materials such as SiC and GaN. State-of-the-art Ga2O3-based devices that have been fabricated to date demonstrate the performance potential for power electronics applications. (C) 2016 The Japan Society of Applied Physics
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页数:7
相关论文
共 39 条
[1]   Growth of β-Ga2O3 Single Crystals by the Edge-Defined, Film Fed Growth Method [J].
Aida, Hideo ;
Nishiguchi, Kengo ;
Takeda, Hidetoshi ;
Aota, Natsuko ;
Sunakawa, Kazuhiko ;
Yaguchi, Yoichi .
JAPANESE JOURNAL OF APPLIED PHYSICS, 2008, 47 (11) :8506-8509
[2]   SEMICONDUCTORS FOR HIGH-VOLTAGE, VERTICAL CHANNEL FIELD-EFFECT TRANSISTORS [J].
BALIGA, BJ .
JOURNAL OF APPLIED PHYSICS, 1982, 53 (03) :1759-1764
[3]   On the bulk β-Ga2O3 single crystals grown by the Czochralski method [J].
Galazka, Zbigniew ;
Irmscher, Klaus ;
Uecker, Reinhard ;
Bertram, Rainer ;
Pietsch, Mike ;
Kwasniewski, Albert ;
Naumann, Martin ;
Schulz, Tobias ;
Schewski, Robert ;
Klimm, Detlef ;
Bickermann, Matthias .
JOURNAL OF CRYSTAL GROWTH, 2014, 404 :184-191
[4]   Anisotropic thermal conductivity in single crystal β-gallium oxide [J].
Guo, Zhi ;
Verma, Amit ;
Wu, Xufei ;
Sun, Fangyuan ;
Hickman, Austin ;
Masui, Takekazu ;
Kuramata, Akito ;
Higashiwaki, Masataka ;
Jena, Debdeep ;
Luo, Tengfei .
APPLIED PHYSICS LETTERS, 2015, 106 (11)
[5]   Temperature-dependent thermal conductivity in Mg-doped and undoped β-Ga2O3 bulk-crystals [J].
Handwerg, M. ;
Mitdank, R. ;
Galazka, Z. ;
Fischer, S. F. .
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2015, 30 (02)
[6]   Reverse characteristics of a 4H-SiC Schottky barrier diode [J].
Hatakeyama, T ;
Shinohe, T .
SILICON CARBIDE AND RELATED MATERIALS 2001, PTS 1 AND 2, PROCEEDINGS, 2002, 389-3 :1169-1172
[7]   First-principles study of the structural, electronic, and optical properties of Ga2O3 in its monoclinic and hexagonal phases [J].
He, Haiying ;
Orlando, Roberto ;
Blanco, Miguel A. ;
Pandey, Ravindra ;
Amzallag, Emilie ;
Baraille, Isabelle ;
Rerat, Michel .
PHYSICAL REVIEW B, 2006, 74 (19)
[8]  
Higashiwaki M., 2013, IEDM, P707
[9]   Temperature-dependent capacitance-voltage and current-voltage characteristics of Pt/Ga2O3 (001) Schottky barrier diodes fabricated on n--Ga2O3 drift layers grown by halide vapor phase epitaxy [J].
Higashiwaki, Masataka ;
Konishi, Keita ;
Sasaki, Kohei ;
Goto, Ken ;
Nomura, Kazushiro ;
Quang Tu Thieu ;
Togashi, Rie ;
Murakami, Hisashi ;
Kumagai, Yoshinao ;
Monemar, Bo ;
Koukitu, Akinori ;
Kuramata, Akito ;
Yamakoshi, Shigenobu .
APPLIED PHYSICS LETTERS, 2016, 108 (13)
[10]  
Higashiwaki M, 2015, 2015 73RD ANNUAL DEVICE RESEARCH CONFERENCE (DRC), P29, DOI 10.1109/DRC.2015.7175536