X-RAY POWDER DIFFRACTION STUDY FOR THE Cu2Cd1-zFezSnSe4 ALLOY SYSTEM

被引：0

作者：

Henao, J. A. ^{[2
]}

Macias, M. A. ^{[2
]}

Quintero, M. ^{[1
]}

Moreno, E. ^{[1
]}

Morocoima, M. ^{[1
]}

Quintero, E. ^{[1
]}

Grima, P. ^{[1
]}

Tovar, R. ^{[1
]}

Bocaranda, P. ^{[1
]}

机构：

[1] Univ Los Andes, Fac Ciencias, Dept Fis, Ctr Estudios Semicond, Merida 5101, Venezuela

[2] Univ Ind Santander, Escuela Quim, Fac Ciencias, GIQUE, Bucaramanga, Colombia

来源：

CHALCOGENIDE LETTERS | 2009年 / 6卷 / 11期

关键词：

Magnetic semiconductors; Crystal structure; X-ray powder diffraction; Rietveld refinement; MAGNETIC-PROPERTIES; CRYSTAL-STRUCTURE; PHASE-DIAGRAM; CU2CD1-ZMNZGESE4; VALUES;

D O I：

暂无

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Room temperature X-ray powder diffraction measurements were carroed out onpolycrystalline samples of the Cu2Cd1-zFezSnSe4 alloy system. The diffraction patterns were used to show the equilibrium conditions and to derive crystalline parameter values. The results confirmed that the alloys are single phase with the tetragonal stannite alpha (I (4) over bar 2m) structure. In each case, the crystal structure was refined using the Rietveld method. Values of the atomic parameters were determined as a function of composition z. It was found that the form of the internal distortion sigma vs z curve is nonlinear. In addition to the tetragonal stannite alpha phase extra X-ray diffraction lines due FeSe2 were observe for as grown samples in the range 0.7<z<1.0. However, it was found that the amount of the extra phase decreased considerably for the compressed samples.

引用

页码：583 / 593

页数：11

共 19 条

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