Simultaneous measurement of X-ray scattering and photoluminescence during molecular deposition

被引：1

作者：

Mrkyvkova, N. ^{[1
,2
]}

Held, V. ^{[1
]}

Halahovets, Y. ^{[1
]}

Nadazdy, P. ^{[1
,3
]}

Jergel, M. ^{[1
,2
]}

Majkova, E. ^{[1
,2
]}

Schreiber, F. ^{[4
]}

Siffalovic, P. ^{[1
,2
]}

机构：

[1] Slovak Acad Sci, Inst Phys, Dubravska cesta 9, Bratislava 845 11, Slovakia

[2] Slovak Acad Sci, Ctr Adv Mat Applicat, Dubravska cesta 9, Bratislava 845 11, Slovakia

[3] Slovak Acad Sci, Inst Elect Engn, Dubravska cesta 9, Bratislava 845 11, Slovakia

[4] Univ Tubingen, Inst Appl Phys, Morgenstelle 10, D-72076 Tubingen, Germany

来源：

JOURNAL OF LUMINESCENCE | 2022年 / 248卷

关键词：

In situ photoluminescence; X-ray scattering; Molecular orientation; Organic thin-film; Vacuum deposition; THIN-FILMS; DIINDENOPERYLENE; SPECTROSCOPY; ORGANIZATION; MORPHOLOGY;

D O I：

10.1016/j.jlumin.2022.118950

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We present a simultaneous in situ measurement of X-ray scattering and photoluminescence (PL) spectroscopy during organic thin-film growth in a vacuum. We have designed a modified deposition chamber that broadens its utilization and enables complementary information on the structure and optoelectronic properties. In a pilot experiment, we investigated the growth of diindenoperylene (DIP) thin films in real time. We found a direct correlation between PL and grazing-incidence wide-angle X-ray scattering (GIWAXS), showing the formation of a new DIP polymorph starting at a layer thickness of ~14 nm. Furthermore, we show that the PL signal is more sensitive to the arrangement of the molecules than GIWAXS in the limit of small layer thicknesses. The presented experimental setup paves the way for performing simultaneous PL and X-ray scattering measurements during the growth of various materials suitable for optoelectronic applications.

引用

页数：5

共 42 条

[1] [Anonymous], 2011, QUANTUM EFFICIENCY 2
[2] Unravelling the multilayer growth of the fullerene C60 in real time
Bommel, S.
Kleppmann, N.
Weber, C.
Spranger, H.
Schaefer, P.
Novak, J.
Roth, S. V.
Schreiber, F.
Klapp, S. H. L.
Kowarik, S.
[J]. NATURE COMMUNICATIONS, 2014, 5
[3] Bowen K., 1998, HIGH RESOLUTION XRAY
[4] Photoluminescence as a probe of molecular organization in PDI8-CN2 ultra-thin films
Brillante, Aldo
Salzillo, Tommaso
Della Valle, Raffaele G.
Venuti, Elisabetta
Borgatti, Francesco
Lunedei, Eugenio
Liscio, Fabiola
Milita, Silvia
Albonetti, Cristiano
[J]. JOURNAL OF LUMINESCENCE, 2017, 187 : 403 - 409
[5] High structural order in thin films of the organic semiconductor diindenoperylene
Dürr, AC
Schreiber, F
Münch, M
Karl, N
Krause, B
Kruppa, V
Dosch, H
[J]. APPLIED PHYSICS LETTERS, 2002, 81 (12) : 2276 - 2278
[6] Colloquium: Cluster growth on surfaces: Densities, size distributions, and morphologies
Einax, Mario
Dieterich, Wolfgang
Maass, Philipp
[J]. REVIEWS OF MODERN PHYSICS, 2013, 85 (03) : 921 - 939
[7] Determination of molecular dipole orientation in doped fluorescent organic thin films by photoluminescence measurements
Frischeisen, Joerg
Yokoyama, Daisuke
Adachi, Chihaya
Bruetting, Wolfgang
[J]. APPLIED PHYSICS LETTERS, 2010, 96 (07)
[8] Optical constants of diindenoperylene in the dependence of preparation temperature and pressure
Greiner, D.
Hinrichs, V.
Wiesner, S.
Ludwig, W.
Fostiropoulos, K.
Keiper, D.
Baumann, P. K.
Meyer, N.
Heuken, M.
Rusu, M.
Lux-Steiner, M. Ch.
[J]. THIN SOLID FILMS, 2013, 534 : 255 - 259
[9] Reorientation of π-conjugated molecules on few-layer MoS2 films
Hagara, Jakub
Mrkyvkova, Nada
Nadazdy, Peter
Hodas, Martin
Bodik, Michal
Jergel, Matej
Majkova, Eva
Tokar, Kamil
Hutar, Peter
Sojkova, Michaela
Chumakov, Andrei
Konovalov, Oleg
Pandit, Pallavi
Roth, Stephan
Hinderhofer, Alexander
Hulman, Martin
Siffalovic, Peter
Schreiber, Frank
[J]. PHYSICAL CHEMISTRY CHEMICAL PHYSICS, 2020, 22 (05) : 3097 - 3104
[10] Optical properties and morphology of thin diindenoperylene films
Heilig, M
Domhan, M
Port, H
[J]. JOURNAL OF LUMINESCENCE, 2004, 110 (04) : 290 - 295

← 1 2 3 4 5 →