Temperature dependence of the electron-hole-plasma electroluminescence from metal-oxide-silicon tunneling diodes

被引:33
|
作者
Liu, CW [1 ]
Chen, MJ
Lin, IC
Lee, MH
Lin, CF
机构
[1] Natl Taiwan Univ, Dept Elect Engn, Taipei 10764, Taiwan
[2] Natl Taiwan Univ, Inst Electroopt Engn, Taipei, Taiwan
关键词
D O I
10.1063/1.1289491
中图分类号
O59 [应用物理学];
学科分类号
摘要
The temperature performance of metal-oxide-silicon tunneling light-emitting diodes was studied. An electron-hole-plasma model can be used to fit all the emission spectra from room temperature to 98 K. At constant voltage bias in the accumulation region, the normalized integral emission intensity slightly increases at low temperature with activation energy as low as 12 meV. From room temperature down to 98 K, the extracted band gaps are similar to 80 meV lower than the value of Varshni equation, and the linewidth drops from 65 to 30 meV. The transverse optical and longitudinal optical phonons are involved in the light-emission process due to the reduction of extracted band gaps and the resemblance between electroluminescence and photoluminescence spectra at similar temperature. (C) 2000 American Institute of Physics. [S0003-6951(00)01934-3].
引用
收藏
页码:1111 / 1113
页数:3
相关论文
共 50 条
  • [1] Room-temperature electroluminescence from electron-hole plasmas in the metal-oxide-silicon tunneling diodes
    Liu, CW
    Lee, MH
    Chen, MJ
    Lin, IC
    Lin, CF
    APPLIED PHYSICS LETTERS, 2000, 76 (12) : 1516 - 1518
  • [2] Enhanced reliability of electroluminescence from metal-oxide-silicon tunneling diodes by deuterium incorporation
    Liu, CW
    Lin, CH
    Lee, MH
    Chang, ST
    Liu, YH
    Chen, MJ
    Lin, CF
    APPLIED PHYSICS LETTERS, 2001, 78 (10) : 1397 - 1399
  • [3] Hot carrier recombination model of visible electroluminescence from metal-oxide-silicon tunneling diodes
    Liu, CW
    Chang, ST
    Liu, WT
    Chen, MJ
    Lin, CF
    APPLIED PHYSICS LETTERS, 2000, 77 (26) : 4347 - 4349
  • [4] Electroluminescence and photoluminescence studies on carrier radiative and nonradiative recombinations in metal-oxide-silicon tunneling diodes
    Chen, MJ
    Chang, JF
    Yen, JL
    Tsai, CS
    Liang, EZ
    Lin, CF
    Liu, CW
    JOURNAL OF APPLIED PHYSICS, 2003, 93 (07) : 4253 - 4259
  • [5] Enhancing electroluminescence from metal-oxide-silicon tunneling diodes by nano-structures of oxide grown by liquid-phase method
    Lin, CF
    Su, TW
    Chung, PF
    Liang, EZ
    Chen, MJ
    Liu, CW
    MATERIALS CHEMISTRY AND PHYSICS, 2003, 77 (02) : 430 - 433
  • [6] Carrier lifetime measurement on electroluminescent metal-oxide-silicon tunneling diodes
    Chen, MJ
    Lin, CF
    Lee, MH
    Chang, ST
    Liu, CW
    APPLIED PHYSICS LETTERS, 2001, 79 (14) : 2264 - 2266
  • [7] Roughness-enhanced electroluminescence from metal oxide silicon tunneling diodes
    Liu, CW
    Lee, MH
    Chen, MJ
    Lin, CF
    Chern, MY
    IEEE ELECTRON DEVICE LETTERS, 2000, 21 (12) : 601 - 603
  • [8] Room-temperature electroluminescence from metal-oxide-silicon-tunneling diodes on (110) substrates
    Liu, Chee-Wee
    Lee, Min-Hung
    Chang, Shu-Tong
    Chen, Miin-Jang
    Lin, Ching-Fuh
    2000, JJAP, Tokyo (39)
  • [9] Room-temperature electroluminescence from metal-oxide-silicon-tunneling diodes on (110) substrates
    Liu, CW
    Lee, MH
    Chang, ST
    Chen, MJ
    Lin, CF
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 2000, 39 (10B): : L1016 - L1018
  • [10] ON TUNNELING IN METAL-OXIDE-SILICON STRUCTURES
    WEINBERG, ZA
    JOURNAL OF APPLIED PHYSICS, 1982, 53 (07) : 5052 - 5056