Transparent p-AgCoO2/n-ZnO diode heterojunction fabricated by pulsed laser deposition

被引:63
|
作者
Ajimsha, R. S.
Vanaja, K. A.
Jayaraj, M. K. [1 ]
Misra, P.
Dixit, V. K.
Kukreja, L. M.
机构
[1] Cochin Univ Sci & Technol, Dept Phys, Optoelect Devices Lab, Cochin 682022, Kerala, India
[2] Raja Ramanna Ctr Adv Technol, Indore 452013, India
关键词
pulsed laser deposition; p-type; p-n junction;
D O I
10.1016/j.tsf.2007.03.002
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Transparent diode heterojunction on ITO coated glass substrates was fabricated using p-type AgCoO2 and n-type ZnO films by pulsed laser deposition (PLD). The PLD of AgCoO2 thin films was carried out using the pelletized sintered target of AgCoO2 powder, which was synthesized in-house by the hydrothermal process. The band gap of these thin films was found to be similar to 3.89 eV and they had transmission of similar to 55% in the visible spectral region. Although Hall measurements could only indicate mixed carrier type conduction but thermoelectric power measurements of Seebeck coefficient confirmed the p-type conductivity of the grown AgCoO2, films. The PLD grown ZnO films showed a band gap of similar to 3.28 eV, an average optical transmission of similar to 85% and n-type carrier density of similar to 4.6 x 1019 cm(-3). The junction between p-AgCoO2 and n-ZnO was found to be rectifying. The ratio of forward current to the reverse current was about 7 at 1.5 V The diode ideality factor was much greater than 2. (c) 2007 Elsevier B.V. All rights reserved.
引用
收藏
页码:7352 / 7356
页数:5
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