The temperature-dependent microstructure of PEDOT/PSS films: insights from morphological, mechanical and electrical analyses

被引：218

作者：

Zhou, Jian ^{[1
]}

Anjum, Dalaver H. ^{[2
]}

Chen, Long ^{[2
]}

Xu, Xuezhu ^{[3
]}

Ventura, Isaac Aguilar ^{[1
]}

Jiang, Long ^{[3
]}

Lubineau, Gilles ^{[1
]}

机构：

[1] King Abdullah Univ Sci & Technol, Phys Sci & Engn Div, COHMAS Lab, Thuwal 239556900, Saudi Arabia

[2] King Abdullah Univ Sci & Technol, Adv Nanofabricat Imaging & Characterizat Core Lab, Thuwal 239556900, Saudi Arabia

[3] N Dakota State Univ, Dept Mech Engn, Fargo, ND 58108 USA

来源：

JOURNAL OF MATERIALS CHEMISTRY C | 2014年 / 2卷 / 46期

关键词：

ELECTROMECHANICAL PROPERTIES; CONDUCTIVITY ENHANCEMENT; TRANSPARENT; ELECTRODE; BEHAVIOR; PSS;

D O I：

10.1039/c4tc01593b

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Poly(3,4-ethylenedioxythiophene)/poly(styrenesulfonate) (PEDOT/PSS) is a widely used conductive polymer in the field of flexible electronics. The ways its microstructure changes over a broad range of temperatures remain unclear. This paper describes microstructure changes at different temperatures and correlates the microstructure with its physical properties (mechanical and electrical). We used High-Angle Annular Dark-Field Scanning Electron Microscopy (HAADF-STEM) combined with electron energy loss spectroscopy (EELS) to determine the morphology and elemental atomic ratio of the film at different temperatures. These results together with the Atomic Force Microscopy (AFM) analysis provide the foundation for a model of how the temperature affects the microstructure of PEDOT/PSS. Moreover, dynamic mechanical analysis (DMA) and electrical characterization were performed to analyze the microstructure and physical property correlations.

引用

页码：9903 / 9910

页数：8

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