Phases transformations in the Ni-Al system investigation by synchrotron radiation diffraction

被引：22
作者：
Sharafutdinov, M. R.
Korchagin, M. A.
Shkodich, N. F.
Tolochko, B. P.
Tsygankov, P. A.
Yagubova, I. Yu.
机构：
[1] SB RAS, Inst Solid State Chem, Novosibirsk, Russia
[2] RAS, Inst Struct Macrokinet, Chernogolovka, Russia
[3] Bauman Moscow State Tech Univ, Moscow, Russia
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2007年 / 575卷 / 1-2期
关键词：
synchrotron radiation; solid state reaction; self-propagating synthesis; thin film;
D O I：
10.1016/j.nima.2007.01.046
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
Phase's transformations during solid state reaction in the mechanically activated (MA) Ni/Al powders and thin films were investigated by time-resolved diffraction (TRXRD). MA samples with different initial composition and activation time were studied. It was found, that the first detected phase was NiAl3 eventhough initial compositions showed NiAl-peak presence. Further reaction came through some phase transformations and final product depends on initial stoichiometry. X-ray pattern obtained for solid state reaction in thin film also showed NiAl3, but followed by one more phase, assumed Ni2Al9. (c) 2007 Elsevier B.V. All rights reserved.
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收藏
页码：149 / 151
页数：3
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