Giant increase in piezoelectric coefficient of AlN by Mg-Nb simultaneous addition and multiple chemical states of Nb

被引:56
作者
Uehara, Masato [1 ,2 ]
Shigemoto, Hokuto [2 ]
Fujio, Yuki [1 ]
Nagase, Toshimi [1 ]
Aida, Yasuhiro [3 ]
Umeda, Keiichi [3 ]
Akiyama, Morito [1 ]
机构
[1] Natl Inst Adv Ind Sci & Technol, Adv Mfg Res Inst, 807-1 Tosu, Saga 8410052, Japan
[2] Kyushu Univ, Dept Mol & Mat Sci, Interdisciplinary Grad Sch Engn Sci, 6-1 Kasuga Kouen, Kasuga, Fukuoka 8168580, Japan
[3] Murata Mfg Co Ltd, 1-10-1 Higashikoutari, Nagaokakyo, Kyoto 6178555, Japan
关键词
FILM RESONATOR TECHNOLOGY; NITRIDE THIN-FILMS; DEPOSITION;
D O I
10.1063/1.4990533
中图分类号
O59 [应用物理学];
学科分类号
摘要
Aluminum nitride (AlN) is one of piezoelectric materials, which are eagerly anticipated for use in microelectromechanical systems (MEMS) applications such as communication resonators, sensors, and energy harvesters. AlN is particularly excellent in generated voltage characteristics for the MEMS rather than oxide piezoelectric materials such as lead zirconium titanate Pb(Zr, Ti)O-3. However, it is necessary to improve the piezoelectric properties of AlN in order to advance the performance of the MEMS. We dramatically increased the piezoelectric coefficient d(33) of AlN films by simultaneously adding magnesium (Mg) and niobium (Nb). The d(33) of Mg39.3Nb25.0Al35.7N is 22 pC/N, which is about four times that of AlN. The d(33) is increased by Mg and Nb simultaneous addition, and is not increased by Mg or Nb single addition. Interestingly, the Nb has multiple chemical states, and which are influenced by the Mg concentration.
引用
收藏
页数:4
相关论文
共 24 条
[1]   Influence of scandium concentration on power generation figure of merit of scandium aluminum nitride thin films [J].
Akiyama, Morito ;
Umeda, Keiichi ;
Honda, Atsushi ;
Nagase, Toshimi .
APPLIED PHYSICS LETTERS, 2013, 102 (02)
[2]   Influence of growth temperature and scandium concentration on piezoelectric response of scandium aluminum nitride alloy thin films [J].
Akiyama, Morito ;
Kano, Kazuhiko ;
Teshigahara, Akihiko .
APPLIED PHYSICS LETTERS, 2009, 95 (16)
[3]   Enhancement of Piezoelectric Response in Scandium Aluminum Nitride Alloy Thin Films Prepared by Dual Reactive Cosputtering [J].
Akiyama, Morito ;
Kamohara, Toshihiro ;
Kano, Kazuhiko ;
Teshigahara, Akihiko ;
Takeuchi, Yukihiro ;
Kawahara, Nobuaki .
ADVANCED MATERIALS, 2009, 21 (05) :593-+
[4]   Characterization of nitride coatings by XPS [J].
Bertóti, I .
SURFACE & COATINGS TECHNOLOGY, 2002, 151 :194-203
[5]   ORIGIN OF FERROELECTRICITY IN PEROVSKITE OXIDES [J].
COHEN, RE .
NATURE, 1992, 358 (6382) :136-138
[6]   Thin-film piezoelectric MEMS [J].
Eom, Chang-Beom ;
Trolier-McKinstry, Susan .
MRS BULLETIN, 2012, 37 (11) :1007-1021
[7]   Properties of hexagonal ScN versus wurtzite GaN and InN [J].
Farrer, N ;
Bellaiche, L .
PHYSICAL REVIEW B, 2002, 66 (20) :2012031-2012034
[8]   Core-level spectra and binding energies of transition metal nitrides by non-destructive x-ray photoelectron spectroscopy through capping layers [J].
Greczynski, G. ;
Primetzhofer, D. ;
Lu, J. ;
Hultman, L. .
APPLIED SURFACE SCIENCE, 2017, 396 :347-358
[9]   Wurtzite structure Sc1-xAlxN solid solution films grown by reactive magnetron sputter epitaxy: Structural characterization and first-principles calculations [J].
Hoglund, Carina ;
Birch, Jens ;
Alling, Bjorn ;
Bareno, Javier ;
Czigany, Zsolt ;
Persson, Per O. A. ;
Wingqvist, Gunilla ;
Zukauskaite, Agne ;
Hultman, Lars .
JOURNAL OF APPLIED PHYSICS, 2010, 107 (12)
[10]   Highly enhanced piezoelectric property of co-doped AlN [J].
Iwazaki, Yoshiki ;
Yokoyama, Tsuyoshi ;
Nishihara, Tokihiro ;
Ueda, Masanori .
APPLIED PHYSICS EXPRESS, 2015, 8 (06)