Developments and perspectives of scanning probe microscopy (SPM) on organic materials systems

被引:50
作者
Jandt, KD
机构
[1] Cornell Univ, Dept Mat Sci & Engn, Ithaca, NY 14853 USA
[2] Cornell Univ, Ctr Mat Sci, Ithaca, NY 14853 USA
关键词
organic materials; biomaterials; polymers; liquid crystals; surfaces; interfaces; morphology; thin films; structure-properties relationships; scanning probe microscopy (SPM); atomic force microscopy (AFM); scanning tunnelling microscopy (STM); scanning force microscopy (SFM); scanning nearfield optical microscopy (SNOM);
D O I
10.1016/S0927-796X(97)00012-0
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In this paper recent developments in scanning probe microscopy (SPM) on organic materials are reviewed with selected examples. Presented subjects include instrumentation and particularities in connection with SPM imaging on soft organic materials. Exemplary cases of structure-properties investigations with SPM in organic materials science including amorphous polymers, polymer crystal growth effects, interface structure and stability, spinodal decomposition effects, copolymer and liquid crystal (LC) nanophase separation, LC phase transitions on a molecular scale, molecular manipulation as well as structure and properties of other organic materials are presented. Naturally, this paper cannot review all papers published about SPM on organic materials. Rather, main principles and problems as well as the strategy of probe microscopy on organic materials is elucidated with selected examples. SPM is shown to be an effective and forceful organic materials analytic tool for the materials scientist. (C) 1998 Elsevier Science S.A. All rights reserved.
引用
收藏
页码:221 / 295
页数:75
相关论文
共 212 条
[1]   ANOMALOUS VOLTAGE DEPENDENCE OF TUNNELLING MICROSCOPY IN WSE2 [J].
AKARI, S ;
STACHEL, M ;
BIRK, H ;
SCHRECK, E ;
LUX, M ;
DRANSFELD, K .
JOURNAL OF MICROSCOPY-OXFORD, 1988, 152 :521-526
[2]   CHEMICAL IMAGING BY SCANNING FORCE MICROSCOPY [J].
AKARI, S ;
HORN, D ;
KELLER, H ;
SCHREPP, W .
ADVANCED MATERIALS, 1995, 7 (06) :549-551
[3]   MICROFABRICATION OF CANTILEVER STYLI FOR THE ATOMIC FORCE MICROSCOPE [J].
ALBRECHT, TR ;
AKAMINE, S ;
CARVER, TE ;
QUATE, CF .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1990, 8 (04) :3386-3396
[4]   IMAGING AND MODIFICATION OF POLYMERS BY SCANNING TUNNELING AND ATOMIC FORCE MICROSCOPY [J].
ALBRECHT, TR ;
DOVEK, MM ;
LANG, CA ;
GRUTTER, P ;
QUATE, CF ;
KUAN, SWJ ;
FRANK, CW ;
PEASE, RFW .
JOURNAL OF APPLIED PHYSICS, 1988, 64 (03) :1178-1184
[5]   MICROSCOPY - SCANNING PROBE MICROSCOPES LOOK INTO NEW TERRITORIES [J].
AMATO, I .
SCIENCE, 1993, 262 (5131) :178-178
[6]  
Amrein M., 1993, P127
[7]  
Apell Hans-Juergen, 1993, P275
[8]  
APELL HJ, 1993, STM SFM BIOL, P284
[9]  
*ASTM SUBC, 1993, E4214 ASTM
[10]   ATOMIC-FORCE MICROSCOPY CHARACTERIZATION OF POLY(AMINO ACID) LANGMUIR-BLODGETT-FILMS [J].
AUDUC, N ;
RINGENBACH, A ;
STEVENSON, I ;
JUGNET, Y ;
DUC, TM .
LANGMUIR, 1993, 9 (12) :3567-3573